BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//UNIFR/WEBMASTER//NONSGML v1.0//EN
CALSCALE:GREGORIAN
BEGIN:VEVENT
DTSTART;VALUE=DATE:20230227T140000
DTEND;VALUE=DATE:20230227T140000
UID:13067@agenda.unifr.ch
DESCRIPTION:
SUMMARY:Optical ellipsometry: A tool for in-situ monitoring  of thin film quality, charge transfer and emergent  magnetism
CATEGORIES:Séminaire
LOCATION:PER 08\, 1.58\, Chemin du Musée 3\, 1700 Fribourg
URL;VALUE=URI:https://agenda.unifr.ch/e/fr/13067
END:VEVENT
END:VCALENDAR